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Semantic Software Lab
Concordia University
Montréal, Canada

DUC/TAC

DUC/TAC competition

{Fuzzy Coreference Resolution for Summarization}

Witte, R., and S. Bergler, "{Fuzzy Coreference Resolution for Summarization}", Proceedings of 2003 International Symposium on Reference Resolution and Its Applications to Question Answering and Summarization (ARQAS), Venice, Italy : Università Ca' Foscari, pp. 43–50, June 23–24, 2003.

{Multi-ERSS and ERSS 2004}

Bergler, S., R. Witte, Z. Li, M. Khalife, Y. Chen, M. Doandes, and A. Andreevskaia, "{Multi-ERSS and ERSS 2004}", Proceedings of Document Understanding Workshop (DUC 2004), Boston Park Plaza Hotel and Towers, Boston, USA : NIST, May 6–7, 2004.

{ERSS 2005: Coreference-Based Summarization Reloaded}

Witte, R., R. Krestel, and S. Bergler, "{ERSS 2005: Coreference-Based Summarization Reloaded}", Proceedings of Document Understanding Workshop (DUC), Vancouver, B.C., Canada, October 9–10, 2005.

{Generating Update Summaries for DUC 2007}

Witte, R., R. Krestel, and S. Bergler, "{Generating Update Summaries for DUC 2007}", Proceedings of Document Understanding Workshop (DUC) at NAACL-HLT 2007, Rochester, NY, USA, April 26–27, 2007.

Fuzzy Clustering for Topic Analysis and Summarization of Document Collections

Kobti, Z., and D. Wu (Eds.), Witte, R., and S. Bergler, "Fuzzy Clustering for Topic Analysis and Summarization of Document Collections", Proceedings of the 20th Canadian Conference on Artificial Intelligence (Canadian A.I. 2007), vol. 4509, Montréal, Québec, Canada : Springer, pp. 476–488, May 28–30, 2007.

Next-Generation Summarization: Contrastive, Focused, and Update Summaries

Witte, R., and S. Bergler, "Next-Generation Summarization: Contrastive, Focused, and Update Summaries", International Conference on Recent Advances in Natural Language Processing (RANLP 2007), Borovets, Bulgaria, September 27–29, 2007.

{ERSS at TAC 2008}

Bellemare, S., S. Bergler, and R. Witte, "{ERSS at TAC 2008}", Proceedings of the First Text Analysis Conference (TAC 2008), Gaithersburg, Maryland, USA : National Institute of Standards and Technology (NIST), November 17--19, 2008.
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